This paper introduces a new concept of testability called consecutive testability and proposes a designfor-testability method for making a given SoC ...

Abstract. This paper introduces a new concept of testability called consecutive testability and proposes a design-for-testability.

Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores · T. Yoneda ; A new design-for-test technique for reducing SOC test time.

This paper presents a design-for consecutive-transparency method that makes a soft core (RTLdescription) consecutively transparent using integer ...

In this paper, we describe how user defined control logic can be synthesized so that self-test features are integrated automatically. For mergeable cores and ...

111. Design for Consecutive Testability of SystemonaChip with BuiltIn Self Testable Cores. 123. Deterministic Test Vector CompressionDecompression for ...

We will discuss five approaches for this testing: level-sensitive scan design (LSSD), scan path, scan/set logic, random-access scan, and self test with BILBO.

This paper analyzes the test and diagnosis challenges and discusses the current solutions to create testable core-based system-chips. The paper mainly ...

This paper addresses the problem of Multi-Chip Module (MCM) testing, and specifically testing the performance of assembled MCMs. The presented solution is ...

There is a slight cost increase due to BIST in design and test development, because of the added time required to design and add pattern generators, response ...