On two-rail logic circuits, path delay faults are always functional sensitizable and may be robust testable. Even if faults that no codeword input vectors ...
Delay Fault Testability on Two-Rail Logic Circuits | Semantic Scholar
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On two-rail logic circuits, path delay faults are always functional sensitizable and may be robust testable and even if faults that no codeword input ...
Oct 1, 2008 · On two-rail logic circuits, path delay faults are always functional sensitizable and may be robust testable. Even if faults that no codeword ...
This paper presents a scan design for delay fault testability of 2-rail logic circuits. The flip flops used in the scan design are based on master-slave ...
On two-rail logic circuits, path delay faults are always functional sensitizable and may be robust testable. Even if faults that no codeword input vectors ...
This paper presents a construction of robust path delay fault test sets for two-rail logic circuits. The proposed test sets do not lead to the over-testing.
This paper presents a scan design for delay fault testa- bility of TRLCs. The flip flops used in the scan design are based on master-slave ones.
SUMMARY. The importance of redundant technologies for improving dependability and delay fault testability are growing. This paper presents.
Two-rail logic circuits can be efficiently tested by noncodeword vector pairs. However, noncodeword vector pairs may sensitize some faults which affect neither ...
Two-rail logic circuits can be efficiently tested by non-codeword vector pairs. However, non-codeword vector pairs may sensitize some path delay faults ...