DP-fill: A dynamic programming approach to X-filling for minimizing peak test power in scan tests. Abstract: At-speed testing is crucial to catch small delay ...
The proposed algorithm when experimented on ITC99 benchmarks produced peak power savings of up to 34% over the best known low power X-filling algorithm for LOS ...
This paper maps the problem of optimal X-filling for peak power minimization during LOS scheme to a variant of interval coloring problem and proposes a ...
Researchers in [15] suggest a method of test vector reordering for shift power minimization by formulating it as an interval colouring problem. The alternate ...
People also ask
What is the DP method in dynamic programming?
What is meant by dynamic programming method in power system?
When a top-down approach to dynamic programming is applied to a problem, it usually?
(PDF) Dp-Fill: A Dynamic Programming Approach to X-Filling
research.amanote.com › publication › dp...
Dp-Fill: A Dynamic Programming Approach to X-Filling for Minimizing Peak Test Power in Scan Tests by Satya A. Trinadh, Sobhan Babu Ch., Shiv Govind.
Oct 22, 2024 · [22] proposed 'X' filling based on dynamic programming and [23] proposed DP filling technique that effectively reduce the average power and peak ...
Apr 25, 2024 · DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests. ... minimization during test. ICCD 2013 ...
This study investigates power reduction of LOS testing through X-filling techniques by using test relaxation to identify don't-care bits (X-bits) in test ...
Aug 31, 2017 · DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests. DATE '15: Proceedings of the 2015 Design ...
In this paper, we present a hybrid X-filling and two-stage test data compression (TS-TDC) techniques for digital VLSI circuits to reduce the test power and ...