This paper presents a new test generation method, which can automatically generate inputs triggering bugs with greatly mitigating the path explosion problem.
Test generation techniques are still weak, especially to large or complex programs. This paper presents a new test generation method, ...
Shaoyin Cheng, Fan Jiang, Jiajie Wang, Tao Zhang, Xuezhi Xing: DBTG: Demand-Driven Backtracking Test Generation. ICYCS 2008: 1944-1950.
Apr 25, 2024 · DBTG: Demand-Driven Backtracking Test Generation. ICYCS 2008: 1944 ... since 2018, dblp has been operated and maintained by: Schloss ...
Keywords. Automated Testing Automatic test generation backtracking bug finding Constraint solving demand-driven Symbolic Execution symbolic execution TTCN-3 ...
This paper presents a new technique for reducing the number of traversed code paths by discarding those that must have side-effects identical to some ...
This paper presents a new test generation method, which can automatically generate inputs triggering bugs with greatly mitigating the path explosion problem.
DBTG: Demand-Driven Backtracking Test Generation ... Test generation techniques are still weak, especially to large or complex programs. This paper presents a new ...
Dynamic test generation is a form of dynamic program analysis that attempts to compute test inputs to drive a program along a specific program path. Directed ...
Missing: DBTG: | Show results with:DBTG:
DBTG: Demand-Driven Backtracking Test Generation pp. 1944-1950. Trusted ... A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter pp.