Oct 13, 2015 · In this paper, a contactless TSV probing method using capacitive coupling is presented. The proposed solution eliminates the risks of direct TSV ...
In this paper, a contactless. TSV probing method using capacitive coupling is presented. The proposed solution eliminates the risks of direct TSV probing and.
A contactless, noninvasive TSV probing scheme based on the principle of capacitive coupling is designed and simulated. The implemented scheme supports the high- ...
The proposed solution eliminates the risks of direct TSV probing and supports the high-density and fine-pitch requirements for TSV Probe, and can be used up ...
Radiative and capacitive coupling can also be utilized as viable contactless access mechanisms for TSV probing. In this paper, these coupling techniques and ...
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A contactless TSV probing method using capacitive coupling is proposed and simulated. A prototype was fabricated using TSMC 65nm CMOS technology to verify ...
Missing: Utilizing | Show results with:Utilizing
The proposed method eliminates the impact of direct probing on TSV and supports the high-density and fine-pitch requirements for TSV probing. 3D full-wave ...
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The proposed contactless probe operates based on the principle of resonant inductive coupling. This coupling method as compared to the conventional inductive ...
This coupling method, as compared to the conventional capacitive coupling technique allows faults detect from longer distances. The results of 3D full wave ...
Design of contactless wafer-level TSV connectivity testing structure using capacitive coupling · Non-contact wafer-level TSV connectivity test methodology using ...