Circuit Topology-Based Test Pattern Generation for Small-Delay Defects
ieeexplore.ieee.org › document
Abstract: For sub-nanometer designs, testing for small-delay defects (SDDs) is essential to achieve low defect escapes for the manufactured silicon.
Abstract. For sub-nanometer designs, testing for small-delay defects. (SDDs) is essential to achieve low defect escapes for the manufac- tured silicon.
It compares the test quality and pattern effectiveness based on several different metrics: delay test coverage as reported by ATPG, total number of long paths ...
A production-friendly method that takes the circuit topology into account while generating patterns for SDDs, and shows that compared to the default ...
The circuit topology-based method leads to only a small increase in the pat- tern count and provides high coverage of gross-delay defects and SDDs. Because only ...
For sub-nanometer designs, testing for small-delay defects (SDDs) is essential to achieve low defect escapes for the manufactured silicon.
These delays are commonly referred to as small-delay defects (SDDs), and testing them is one of the major challenges that the semiconductor industry is facing ...
Multicycle tests have advantages in defect detection and test compaction. This study addresses the on-chip generation ofprimary input sequences for the ...
Topological Methods 100% · Test Case Generation 100% · Circuit Topology 100% · Small Delay Defects 100% · Time-aware 40% · Pattern Count 40% · Design Testing 20%.
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects · 8.1 Introduction · 8.2 Circuit Topology-Based Fault Selection · 8.3 SDD Pattern Generation.