This paper presents an improved register–transfer level functional partitioning approach for testability. Based on an earlier work (X. Gu, K. Kuchcinski, ...

This paper presents an improved register-transfer level functional partitioning approach for testability. Based on the earlier work (Kuchcinski and Peng ...

Improved register-transfer level functional partitioning approach for testability with advantages compared with other conventional approaches is presented.

An improved register-transfer level functional partitioning approach for testability. Authors: Tianruo Yang. Tianruo Yang. View Profile. , Zebo Peng. Zebo Peng.

Various approaches have been proposed to enhance the testability of VLSI by incorporating extra testability features. Recent advances in VLSI technology are ...

[YP98] Tianruo Yang, Zebo Peng, "An improved register-transfer level functional partitioning approach for testability", 24th EUROMICRO Conference, 1998. ( ! ) ...

RTL fault simulation method is analogous to the gate level approach, in which good and faulty circuits are created based on the single stuck-at fault ...

Register Allocation with Simultaneous BIST Intrusion pp. 10099. An Improved Register-Transfer Level Functional Partitioning Approach for Testability pp.

An improved register-transfer level functional partitioning approach for testability · L. YangZebo Peng. Computer Science, Engineering. Proceedings. 24th ...

In this paper, we present an improved register-transfer level built-in self-test partitioning approach. It is based on a BIST testability analysis algorithm ...