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May 2, 2017 · This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs).
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Jun 25, 2017 · Abstract: This paper presents a novel single event transient (SET) meas- urement circuit in SRAM-based field programmable gate arrays ...
May 10, 2019 · This paper presents a new approach for analyzing the effect of single-event transient (SET) in SRAM-based field-programmable gate array (FPGA) devices.
This paper addresses the issue of obstacle avoidance in quadcopters used in Search and Rescue missions.
Glitches within combinatorial circuitry are identified as Single Event Transients (SETS). Terrestrial devices have fault vulnerability mostly due to: alpha ...
Xu X. et al. A single event transient detector in SRAM-based FPGAs // IEICE Electronics Express. 2017. Vol. 14. No. 12. p. 20170210. ... Xu X., Liang H., Huang Z.
In SRAM-based FPGAs, the basic programmable via is a single-bit SRAM cell. This via is programmed and erased the same way as any other. SRAM memory cell.
This paper introduces an experimental test-flow for evaluating the susceptibility of SRAM based FPGA designs to SEU (Single Event Upsets). Using this method it ...
The new technique proposed in this paper was specifically developed for FPGAs to cope with transient faults in the user combinational and sequential logic, ...
This work presents a new design methodology for SRAM-based FPGAs on custom layout isolation capable to reduce the circuit failure rate and outperforming ...
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