Did you mean: A programmable built-in self-test for embedded DRAMa.
Abstract: A memory test algorithm for detecting neighborhood pattern sensitive faults (NPSFs), including static NPSF (SNPSF), passive NPSF (PNPSF) and ...
This paper proposes a programmable Built-In Self-Test (BIST) approach for DRAM test and diagnosis. The proposed architecture suits well for embedded core
In the present invention a built in self test (BIST) for an embedded memory is described. The BIST can be used at higher levels of assembly and for ...
Testing eDRAM is more dif£- cult than testing commodity DRAM. First of all, accessing the deeply embedded DRAM core from an external memory tester is costly.
A memory test algorithm for detecting neighborhood pattern sensitive faults (NPSFs), including static NPSF (SNPSF), passive NPSf (PNPSF) and active NPSFs, ...
A memory test algorithm for detecting neighborhood pattern sensitive faults (NPSFs), including ststic NPSF (SNPSF), passive NPSF (PNPSF) and active NPSF ...
In the present invention a built in self test (BIST) for an embedded memory is described. The BIST can be used at higher levels of assembly and for ...
Abstract—Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron tech- nology and system-on-chip applications.
A programmable Built In Self Test (pBIST) system used to test embedded memories where a plurality of memories requiring different testing conditions are ...
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This paper proposes a programmable Built-In Self-Test (BIST) approach for DRAM test and diagnosis. The proposed architecture suits well for embedded core ...