A scheme is proposed for filling the don't-care bits to maximize the number of consecutive equal-length-run and improve test compression. In addition, the ...
Abstract: A new scheme of test data compression, namely equal-run-length coding (ERLC) scheme is presented, which is based on run-length.
A new scheme of test data compression based on run-length, namely equal-run-length coding (ERLC) is presented. It is based on both types of runs of 0's and 1's ...
A new scheme of test data compression, namely equal- run-length coding (ERLC) scheme is presented, which is based on run-length. It first considers both ...
A new scheme of test data compression based on run-length, namely equal-run-length coding (ERLC) is presented. It is based on both types of runs of 0s and ...
In this paper, we propose a novel, lossless, time and memory minimizing test data compression scheme based on the fixed to variable length coding with limited ...
A new scheme of test data compression, namely equal-run-length coding (ERLC) scheme is presented,which is based on run-length. It first considers both types ...
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A new scheme of test data compression, namely equal-run-length coding (ERLC) scheme is presented, which is based on run-length.
This paper presents a new X-filling algorithm for test power reduction and a novel encoding technique for test data compression in scan- based VLSI testing.
A new scheme of test data compression based on equal-run-length coding (ERLC) · Wenfa ZhanA. El-Maleh. Computer Science. Integr. 2012. 22 Citations. Add to ...