Abstract: A method is presented for testing digital circuits during normal operation. The resources used to perform online testing are those which are ...
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Abstract-In this paper, we present a method of testing digital cir- cuits during normal operation. The resources used to perform on-line.
Concurrent testing technique for digital circuits. Thumbnail. File(s). file_1.pdf (1.719Mb). Date. 1988. Author. Saluja, Kewal K. Sharma, Rajiv.
With this method, the length of time required for all of the test vectors to appear, possibly in some order, among the normal inputs to the circuit under ...
A method is presented for testing digital circuits during normal operation. The resources used to perform online testing are those which are inserted to ...
Abstract: A method is presented for testing digital circuits during normal operation. The resources used to perform online testing are those which are ...
In this work, we extend the use of compaction methods for concurrent testing of analog-to-digital converters. We estimate tolerance bounds for the result of ...
In this paper, we present a method of testing digital circuits during normal operation. The resources used to perform on-line testing are those which are ...
In this work, we extend the use of compaction methods for concurrent testing of analog-to-digital converters. We estimate tolerance bounds for the result of ...
Oct 8, 2024 · The technique can handle generic digital circuits with cell count as high as 15,000 and having the order of 2500 states. Results for design ...