Abstract: The quality of at-speed testing is being severely challenged by the problem that an inter-clock logic block existing between two synchronous ...

This paper addresses the problem with a novel inter-clock at-speed test control scheme, featuring a compact and robust on-chip inter-clock enable generator ...

Abstract: The quality of at-speed testing is being severely challenged by the problem that an inter-clock logic block existing between two synchronous ...

A novel inter-clock at-speed test control scheme, featuring a compact and robust on-chip inter- clock enable generator design, that can generate inter-Clock ...

Wu, “A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing,” Proceedings of IEEE International Test Conference, pp. 1-10, 2006. [8] Xiaoxin ...

12 References ; A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing · H. FurukawaX. WenLaung-Terng WangBoryau SheuZhigang JiangShianling Wu ; At ...

Oct 22, 2024 · This paper presents a clock-chain based test clock control scheme using an internal phase-locked-loop (PLL) as the at-speed test clock generator ...

The quality of at-speed testing is determined by two or more edges of the functional clock. The clock edge at which the last shift occurs is the update edge.

In this paper, a fast test integration approach for multi-clock-domain at-speed testing based on IEEE Standard 1500 is proposed. The proposed framework has been ...

We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter- ...