A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

Jan 18, 2008 · A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset ...

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells.

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

In this paper, we propose a novel area-efficient gating scan architecture that offers an integrated solution for reducing total average power in both scan cells ...

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

Mar 18, 2021 · The 'NSC' architecture proposed reduces patterns count up to 78.14% for the same test coverage. This also helps to reduce the overall cost of an IC ...

The proposed scan-based test scheme accesses only a subset of scan cells for loading the subsequent test stimulus while freezing the remaining scan cells with ...