The authors propose an efficient deterministic method of delay fault test generation. For most common circuits, the proposed technique has a time complexity ...
People also ask
What is delay fault testing?
What are the methods of test generation?
What are the models of delay fault?
The authors propose an efficient deterministic method of delay fault test generation. For most common circuits, the proposed technique has a time complexity ...
Consequently, we propose an efficient deterministic method of delay fault test generation. For most common circuits, our proposed technique has a time ...
The authors propose an efficient deterministic method of delay fault test generation. For most common circuits, the proposed technique has a time complexity ...
Oct 22, 2024 · This letter addresses the problem of delay fault test generation in circuits using macros whose implementation is not known.
Single input change (SIC): a simpler method of generating non-robust tests. Use a combinational ATPG algorithm to statically sensitize the entire path for V2.
We propose a new coverage metric and a two-pass test generation method for delay faults in combinational circuits. The coverage metric termed as line delay ...
This report describes an algorithm for generating tests for path delay faults; these faults are models of the faulty switching behavior of digital circuits. The ...
An optimal delay test for a gate delay fault is a test that sensitizes the longest functional path through the fault site. Especially the cone-oriented test ...
The tests are mostly generated in professional ATPG (automatic test pattern generation) tools for transition faults and path delay faults. In many published ...