We propose a procedure for generating test patterns for diagnosis of combinational (or fully-scanned sequential) circuits based on stuck-at faults.
We propose a procedure for generating test patterns for diagnosis of combinational (or fully-scanned sequential) circuits based on stuck-at faults. The test ...
We propose a procedure for generating test patterns for diagnosis of combinational (or fully-scanned sequential) circuits based on stuck-at faults.
We propose a procedure for generating test sequences fordiagnosis of synchronous sequential circuits based onstuck-at faults. The test generation procedure ...
Irith Pomeranz, W. Kent Fuchs: A Diagnostic Test Generation Procedure for Combinational Circuits Based on Test Elimination. Asian Test Symposium 1998: 486- ...
We propose a procedure for generating test sequences for diagnosis of synchronous sequential circuits based on stuck at faults. In this procedure, we avoid ...
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The DATPG aim to generate tests to distinguish fault pairs, i.e., two faults must have different output responses. Given a fault pair, by modifying circuit ...
A diagnostic test pattern generator using a Satisfiability Modulo Theory (SMT) solver is proposed. Rather than targeting a single fault pair at a time, ...
A diagnostic test generation procedure for combinational circuits based on test elimination · Computer Science, Engineering. Proceedings Seventh Asian Test ...
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The DATPG aim to generate tests to distinguish fault pairs, i.e., two faults must have different output responses. Given a fault pair, by modifying circuit ...