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Phase Extraction of Electronic Speckle Interference Fringe Image based on Convolutional Neural Network

Published: 24 September 2021 Publication History

Abstract

Electronic speckle pattern interferometry (ESPI) is a kind of full-field, non-contact nondestructive measurement technology, which is suitable for deformation measurement and nondestructive testing of optical rough surface. Fringe phase is an important information of interference fringe image, and the accuracy of phase estimation plays an important role in the extraction of fringe information. However, because of the discontinuity of fringe image and the influence of noise, phase extraction has always been a challenging problem. In this paper, we propose a fringe image phase extraction technique based on convolutional neural network, and experimental results show that this method has a good effect on phase estimation of the interference fringe.

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ICCAI '21: Proceedings of the 2021 7th International Conference on Computing and Artificial Intelligence
April 2021
498 pages
ISBN:9781450389501
DOI:10.1145/3467707
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

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Published: 24 September 2021

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Author Tags

  1. Convolutional Neural Network
  2. Electronic speckle pattern interferometry
  3. The phase estimation

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  • Program for Innovative Research Team in University of Tianjin

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ICCAI '21

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