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Automating RT-level operand isolation to minimize power consumption in datapaths

Published: 01 January 2000 Publication History
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References

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M. Abramovici, M. A. Breuer, and A. D. Friedman. Digital Systems Testing and Testable Design. IEEE Press, 1990.
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A. E Chandrakasan and R. W. Brodersen. Low Power Digital CMOS Design. Kluwer Academic Publishers, 1995.
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A. Correale. Overview of the Power Minimization Techniques Employed in the IBM PowerPC 4xx Embedded Controllers. In Proceedings of the 1995 ACM/IEEE International Symposium on Low Power Design, pages 75-80, Apr. 1995.
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H. Kapadia, L. Benini, and G. D. Micheli. Reducing Switching Activity on Datapath Buses with Control-Signal Gating. IEEE Journal of Solid-State Circuits, 34(3):405-414, Mar. 1999.
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P.E. Landman. Low-Power Architectural Design Methodologies. PhD thesis, College of Engineering, University of California, Berkeley, 1994.
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M. Mtinch. Synthesis and Optimization of Algorithmic Hardware Descriptions. PhD thesis, University of Kaiserslautern, 1999.
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M. Pedram. Power Minimization in IC Design: Principles and Architectures. ACM Transactions on Design Automation of Electronic Systems, 1 (1): 1-66, Jan. 1996.
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Synopsys, Inc., Mountain View, CA. Synopsys Power Products Reference Manual, v1997.08 edition, 1997.
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V. Tiwari, S. Malik, and R Ashar. Guarded Evaluation: Pushing Power Management to Logic Synthesis/Design. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, 17(10):1051-1060, Oct. 1998.

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        cover image ACM Conferences
        DATE '00: Proceedings of the conference on Design, automation and test in Europe
        January 2000
        707 pages
        ISBN:1581132441
        DOI:10.1145/343647
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        • EDAA: European Design Automation Association
        • ECSI
        • EDAC: Electronic Design Automation Consortium
        • SIGDA: ACM Special Interest Group on Design Automation
        • IEEE-CS: Computer Society
        • IFIP: International Federation for Information Processing
        • The Russian Academy of Sciences: The Russian Academy of Sciences

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        New York, NY, United States

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        Published: 01 January 2000

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        • EDAA
        • EDAC
        • SIGDA
        • IEEE-CS
        • IFIP
        • The Russian Academy of Sciences
        DATE00: Design Automation and Test in Europe
        March 27 - 30, 2000
        Paris, France

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