research-article

Uniform Random Sampling Product Configurations of Feature Models That Have Numerical Features

Authors:

Daniel-Jesus Munoz,

Don BatoryAuthors Info & Claims

SPLC '19: Proceedings of the 23rd International Systems and Software Product Line Conference - Volume A

Pages 289 - 301

https://doi.org/10.1145/3336294.3336297

Published: 09 September 2019 Publication History

Abstract

Analyses of Software Product Lines (SPLs) rely on automated solvers to navigate complex dependencies among features and find legal configurations. Often these analyses do not support numerical features with constraints because propositional formulas use only Boolean variables. Some automated solvers can represent numerical features natively, but are limited in their ability to count and Uniform Random Sample (URS) configurations, which are key operations to derive unbiased statistics on configuration spaces.

Bit-blasting is a technique to encode numerical constraints as propositional formulas. We use bit-blasting to encode Boolean and numerical constraints so that we can exploit existing #SAT solvers to count and URS configurations. Compared to state-of-art Satisfiability Modulo Theory and Constraint Programming solvers, our approach has two advantages: 1) faster and more scalable configuration counting and 2) reliable URS of SPL configurations. We also show that our work can be used to extend prior SAT-based SPL analyses to support numerical features and constraints.

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Cited By

Sundermann CLoth JThüm TFilkov VRay BZhou M(2024)Efficient Slicing of Feature Models via Projected d-DNNF CompilationProceedings of the 39th IEEE/ACM International Conference on Automated Software Engineering10.1145/3691620.3695594(1332-1344)Online publication date: 27-Oct-2024
https://dl.acm.org/doi/10.1145/3691620.3695594
Sundermann CRaab HHeß TThüm TSchaefer I(2024)Reusing d-DNNFs for Efficient Feature-Model CountingACM Transactions on Software Engineering and Methodology10.1145/368046533:8(1-32)Online publication date: 30-Jul-2024
https://dl.acm.org/doi/10.1145/3680465
Sundermann CHeß TSundermann RKuiter EKrieter SThüm T(2024)Generating Feature Models with UVL's Full ExpressivenessProceedings of the 28th ACM International Systems and Software Product Line Conference10.1145/3646548.3676602(61-65)Online publication date: 2-Sep-2024
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Index Terms

Uniform Random Sampling Product Configurations of Feature Models That Have Numerical Features
1. Software and its engineering
  1. Software creation and management
    1. Software development techniques
      1. Reusability
        Software product lines
  2. Software organization and properties
    1. Extra-functional properties
      1. Software performance
    2. Software system structures
      1. Software system models
        Model-driven software engineering
2. Theory of computation
  1. Logic
    1. Automated reasoning
    2. Logic and verification

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cover image ACM Other conferences

SPLC '19: Proceedings of the 23rd International Systems and Software Product Line Conference - Volume A

September 2019

356 pages

ISBN:9781450371384

DOI:10.1145/3336294

Editors:
Thorsten Berger
Chalmers | University of Gothenburg, Sweden
,
Philippe Collet
Université Côte d'Azur, France
,
Laurence Duchien
University Lille, France
,
Thomas Fogdal
Danfoss Power Electronics A/S, Denmark
,
Patrick Heymans
University of Namur, Belgium
,
Timo Kehrer
Humboldt-Universität zu Berlin, Germany
,
Jabier Martinez
Tecnalia, Spain
,
Raúl Mazo
University Paris 1 Panthéon-Sorbonne, France
,
Leticia Montalvillo
IK4-IKERLAN Research Center, Spain
,
Camille Salinesi
University Paris 1 Panthéon-Sorbonne, France
,
Xhevahire Tërnava
Sorbonne University, France
,
Thomas Thüm
TU Braunschweig, Germany
,
Tewfik Ziadi
Sorbonne University, France

Copyright © 2019 ACM.

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Published: 09 September 2019

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Center for Hierarchical Manufacturing, National Science Foundation
Consejería de Economía, Innovación, Ciencia y Empleo, Junta de Andalucía
Ministerio de Economía y Competitividad

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SPLC 2019

SPLC 2019: 23rd International Systems and Software Product Line Conference

September 9 - 13, 2019

Paris, France

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Overall Acceptance Rate 167 of 463 submissions, 36%

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https://dl.acm.org/doi/10.1145/3691620.3695594
Sundermann CRaab HHeß TThüm TSchaefer I(2024)Reusing d-DNNFs for Efficient Feature-Model CountingACM Transactions on Software Engineering and Methodology10.1145/368046533:8(1-32)Online publication date: 30-Jul-2024
https://dl.acm.org/doi/10.1145/3680465
Sundermann CHeß TSundermann RKuiter EKrieter SThüm T(2024)Generating Feature Models with UVL's Full ExpressivenessProceedings of the 28th ACM International Systems and Software Product Line Conference10.1145/3646548.3676602(61-65)Online publication date: 2-Sep-2024
https://dl.acm.org/doi/10.1145/3646548.3676602
Sundermann CBrancaccio VKuiter EKrieter SHeß TThüm T(2024)Collecting Feature Models from the Literature: A Comprehensive Dataset for Benchmarking28th ACM International Systems and Software Product Line Conference10.1145/3646548.3672590(54-65)Online publication date: 2-Sep-2024
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Pett TKrieter SThüm TSchaefer I(2024)MulTi-Wise Sampling: Trading Uniform T-Wise Feature Interaction Coverage for Smaller SamplesProceedings of the 28th ACM International Systems and Software Product Line Conference10.1145/3646548.3672589(47-53)Online publication date: 2-Sep-2024
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Fernandez-Amoros DHeradio RHorcas Aguilera JGalindo JBenavides DFuentes L(2024)Pragmatic Random Sampling of the Linux Kernel: Enhancing the Randomness and Correctness of the conf ToolProceedings of the 28th ACM International Systems and Software Product Line Conference10.1145/3646548.3672586(24-35)Online publication date: 2-Sep-2024
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Güthing LWeiß MSchaefer ILochau M(2024)Sampling Cardinality-Based Feature ModelsProceedings of the 18th International Working Conference on Variability Modelling of Software-Intensive Systems10.1145/3634713.3634719(46-55)Online publication date: 7-Feb-2024
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Baranov ELegay A(2024)Baital: Sampling Configurable Systems with high t-wise coverageScience of Computer Programming10.1016/j.scico.2024.103209(103209)Online publication date: Sep-2024
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Romero-Organvidez DHorcas JGalindo JBenavides D(2024)Data visualization guidance using a software product line approachJournal of Systems and Software10.1016/j.jss.2024.112029213:COnline publication date: 1-Jul-2024
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Oh JBatory DHeradio R(2023)Finding Near-optimal Configurations in Colossal Spaces with Statistical GuaranteesACM Transactions on Software Engineering and Methodology10.1145/361166333:1(1-36)Online publication date: 23-Nov-2023
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