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Writing without Disturb on Phase Change Memories by Integrating Coding and Layout Design

Published: 05 October 2015 Publication History

Abstract

We integrate coding techniques and layout design to eliminate write-disturb in phase change memories (PCMs), while enhancing lifetime and host-visible capacity. We first propose a checkerboard configuration for cell layout to eliminate write-disturb while doubling the memory lifetime. We then introduce two methods to jointly design Write-Once-Memory (WOM) codes and layout. The first WOM-layout design improves the lifetime by more than double without compromising the host-visible capacity. The second design applies WOM codes to even more dense layouts to achieve both lifetime and capacity gains. The constructions demonstrate that substantial improvements to lifetime and host-visible capacity are possible by co-designing coding and cell layout in PCM.

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MEMSYS '15: Proceedings of the 2015 International Symposium on Memory Systems
October 2015
278 pages
ISBN:9781450336048
DOI:10.1145/2818950
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

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Published: 05 October 2015

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  1. Phase Change Memory
  2. Write-Disturb
  3. Write-Once-Memory Codes

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MEMSYS '15
MEMSYS '15: International Symposium on Memory Systems
October 5 - 8, 2015
DC, Washington DC, USA

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