research-article

Fitting standard cell performance to generalized Lambda distributions

Authors:

Hendrik T. MauAuthors Info & Claims

GLSVLSI '11: Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI

Pages 259 - 264

https://doi.org/10.1145/1973009.1973061

Published: 02 May 2011 Publication History

Abstract

It is well known that random fluctuations in integrated circuit manufacturing introduce variations in circuit performance. While a lot of effort has been spent on circuit variability, fitting performance parameter distributions has not been extensively examined. Our work analyzes whether the Generalized Lambda Distribution suits approximating circuit performance characteristics. We focus on statistical standard cell characterization as an important step towards statistical gate-level and system-level analyses. Our results show that the Generalized Lambda Distribution is not applicable to raw leakage power data. However, timing data and dynamic power consumption may be approximated well. The high characterization effort has to be overcome to achieve industrial application.

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Cited By

Lange ASohrmann CJancke RHaase JLorenz ISchlichtmann UFettweis GNebel W(2014)Probabilistic standard cell modeling considering non-gaussian parameters and correlationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616887(1-4)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2616887
Ellinger FMikolajick TFettweis GHentschel DKolodinski SWarnecke HReppe TTzschoppe CDohl JCarta CFritsche DTretter GWiatr MKronholz SMikalo RHeinrich HPaulo RWolf RHübner JWaltsgott JMeißner KRichter RMichler OBausinger MMehlich HHahmann MMöller HWiemer MHolland HGärtner RSchubert SRichter AStrobel AFehske ACech SAßmann UPawlak ASchröter MFinger WSchumann SHöppner SWalter DEisenreich HSchüffny R(2013)Energy efficiency enhancements for semiconductors, communications, sensors and software achieved in cool silicon cluster projectThe European Physical Journal Applied Physics10.1051/epjap/201312048063:1(14402)Online publication date: 5-Jul-2013
https://doi.org/10.1051/epjap/2013120480
Ellinger FMikolajik TFettweis GHentschel DKolodinski SWarnecke HReppe TTzschoppe CDohl JCarta CFritsche DWiatr MKronholz SMikalo RHeinrich HPaulo RWolf RHubner JWaltsgott JMeissner KRichter RBausinger MMehlich HHahmann MMoller HWiemer MHolland HGartner RSchubert SRichter AStrobel AFehske ACech SAssmann UHoppner SWalter DEisenreich HSchuffny R(2012)Cool silicon ICT energy efficiency enhancements2012 International Semiconductor Conference Dresden-Grenoble (ISCDG)10.1109/ISCDG.2012.6360004(1-4)Online publication date: Sep-2012
https://doi.org/10.1109/ISCDG.2012.6360004
Show More Cited By

Index Terms

Fitting standard cell performance to generalized Lambda distributions
1. Hardware
  1. Hardware validation
  2. Very large scale integration design
    1. Application-specific VLSI designs
      1. Application specific processors

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cover image ACM Conferences

GLSVLSI '11: Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI

May 2011

496 pages

ISBN:9781450306676

DOI:10.1145/1973009

General Chairs:
David Atienza
EPFL, Switzerland
,
Yuan Xie
Penn State University, USA
,
Program Chairs:
Jose L. Ayala
Federal University of Pernambuco, Brazil
,
Ken Stevens
University of Utah, USA

Copyright © 2011 ACM.

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Published: 02 May 2011

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GLSVLSI '11: Great Lakes Symposium on VLSI 2011

May 2 - 4, 2011

Lausanne, Switzerland

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Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Cited By

Lange ASohrmann CJancke RHaase JLorenz ISchlichtmann UFettweis GNebel W(2014)Probabilistic standard cell modeling considering non-gaussian parameters and correlationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616887(1-4)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2616887
Ellinger FMikolajick TFettweis GHentschel DKolodinski SWarnecke HReppe TTzschoppe CDohl JCarta CFritsche DTretter GWiatr MKronholz SMikalo RHeinrich HPaulo RWolf RHübner JWaltsgott JMeißner KRichter RMichler OBausinger MMehlich HHahmann MMöller HWiemer MHolland HGärtner RSchubert SRichter AStrobel AFehske ACech SAßmann UPawlak ASchröter MFinger WSchumann SHöppner SWalter DEisenreich HSchüffny R(2013)Energy efficiency enhancements for semiconductors, communications, sensors and software achieved in cool silicon cluster projectThe European Physical Journal Applied Physics10.1051/epjap/201312048063:1(14402)Online publication date: 5-Jul-2013
https://doi.org/10.1051/epjap/2013120480
Ellinger FMikolajik TFettweis GHentschel DKolodinski SWarnecke HReppe TTzschoppe CDohl JCarta CFritsche DWiatr MKronholz SMikalo RHeinrich HPaulo RWolf RHubner JWaltsgott JMeissner KRichter RBausinger MMehlich HHahmann MMoller HWiemer MHolland HGartner RSchubert SRichter AStrobel AFehske ACech SAssmann UHoppner SWalter DEisenreich HSchuffny R(2012)Cool silicon ICT energy efficiency enhancements2012 International Semiconductor Conference Dresden-Grenoble (ISCDG)10.1109/ISCDG.2012.6360004(1-4)Online publication date: Sep-2012
https://doi.org/10.1109/ISCDG.2012.6360004
Lange ASohrmann CJancke RHaase JCheng BKovac UAsenov A(2011)A general approach for multivariate statistical MOSFET compact modeling preserving correlations2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)10.1109/ESSDERC.2011.6044209(163-166)Online publication date: Sep-2011
https://doi.org/10.1109/ESSDERC.2011.6044209

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