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System-level throughput analysis for process variation aware multiple voltage-frequency island designs

Published: 03 October 2008 Publication History

Abstract

The increasing variability in manufacturing process parameters is expected to lead to significant performance degradation in deep submicron technologies. Multiple Voltage-Frequency Island (VFI) design styles with fine-grained, process-variation aware clocking have recently been shown to possess increased immunity to manufacturing process variations. In this article, we propose a theoretical framework that allows designers to quantify the performance improvement that is to be expected if they were to migrate from a fully synchronous design to the proposed multiple VFI design style. Specifically, we provide techniques to efficiently and accurately estimate the probability distribution of the execution rate (or throughput) of both single and multiple VFI systems under the influence of manufacturing process variations. Finally, using an MPEG-2 encoder benchmark, we demonstrate how the proposed analysis framework can be used by designers to make architectural decisions such as the granularity of VFI domain partitioning based on the throughput constraints their systems are required to satisfy.

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  1. System-level throughput analysis for process variation aware multiple voltage-frequency island designs

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    cover image ACM Transactions on Design Automation of Electronic Systems
    ACM Transactions on Design Automation of Electronic Systems  Volume 13, Issue 4
    September 2008
    328 pages
    ISSN:1084-4309
    EISSN:1557-7309
    DOI:10.1145/1391962
    Issue’s Table of Contents
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 03 October 2008
    Accepted: 01 May 2008
    Revised: 01 January 2008
    Received: 01 April 2007
    Published in TODAES Volume 13, Issue 4

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    Author Tags

    1. Globally asynchronous locally synchronous
    2. manufacturing process variations
    3. maximum cycle mean
    4. performance analysis
    5. system-level design
    6. voltage-frequency islands

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