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A transitive closure based algorithm for test generation

Authors:

Srimat T. Chakradhar,

Vishwani D. AgrawalAuthors Info & Claims

DAC '91: Proceedings of the 28th ACM/IEEE Design Automation Conference

Pages 353 - 358

https://doi.org/10.1145/127601.127693

Published: 01 June 1991 Publication History

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Roy SMillican SAgrawal V(2024)A Survey and Recent Advances: Machine Intelligence in Electronic TestingJournal of Electronic Testing10.1007/s10836-024-06117-740:2(139-158)Online publication date: 15-Apr-2024
https://doi.org/10.1007/s10836-024-06117-7
Eggersglüß SMilewski SRajski JTyszer J(2023)A New Static Compaction of Deterministic Test SetsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2023.324024631:4(411-420)Online publication date: Apr-2023
https://doi.org/10.1109/TVLSI.2023.3240246
Roy SMillican SAgrawal V(2021)Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits2021 IEEE 39th VLSI Test Symposium (VTS)10.1109/VTS50974.2021.9441051(1-14)Online publication date: 25-Apr-2021
https://doi.org/10.1109/VTS50974.2021.9441051
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A transitive closure based algorithm for test generation
1. Hardware
2. Theory of computation
  1. Randomness, geometry and discrete structures

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A transitive closure algorithm for test generation

A transitive-closure-based test generation algorithm is presented. A test is obtained by determining signal values that satisfy a Boolean equation derived from the neural network model of the circuit incorporating necessary conditions for fault ...
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This paper presents an efficient scalable parallel algorithm for transitive closure computation and its application to solve VLSI test generation problem. The transitive closure computation is the core of the test generation process and it will take huge ...
A transitive closure algorithm
Abstract
An algorithm is given for computing the transitive closure of a directed graph in a time no greater thana ₁ N ₁ n+a ₂ n ² for largen wherea ₁ anda ₂ are constants depending on the computer used to execute the algorithm,n is the number of nodes in the graph ...

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DAC '91: Proceedings of the 28th ACM/IEEE Design Automation Conference

June 1991

783 pages

ISBN:0897913957

DOI:10.1145/127601

Chairman:
A. Richard Newton
Univ. of California, Berkeley

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 01 June 1991

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DAC91: The 28th ACM/IEEE Design Automation Conference

June 17 - 22, 1991

California, San Francisco, USA

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Roy SMillican SAgrawal V(2024)A Survey and Recent Advances: Machine Intelligence in Electronic TestingJournal of Electronic Testing10.1007/s10836-024-06117-740:2(139-158)Online publication date: 15-Apr-2024
https://doi.org/10.1007/s10836-024-06117-7
Eggersglüß SMilewski SRajski JTyszer J(2023)A New Static Compaction of Deterministic Test SetsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2023.324024631:4(411-420)Online publication date: Apr-2023
https://doi.org/10.1109/TVLSI.2023.3240246
Roy SMillican SAgrawal V(2021)Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits2021 IEEE 39th VLSI Test Symposium (VTS)10.1109/VTS50974.2021.9441051(1-14)Online publication date: 25-Apr-2021
https://doi.org/10.1109/VTS50974.2021.9441051
Eggersglus SMilewski SRajski JTyszer J(2021)On Reduction of Deterministic Test Pattern Sets2021 IEEE International Test Conference (ITC)10.1109/ITC50571.2021.00035(260-267)Online publication date: Oct-2021
https://doi.org/10.1109/ITC50571.2021.00035
Bordeaux LHamadi YZhang L(2006)Propositional Satisfiability and Constraint ProgrammingACM Computing Surveys10.1145/1177352.117735438:4(12-es)Online publication date: 25-Dec-2006
https://dl.acm.org/doi/10.1145/1177352.1177354
Tiwari VMalik SAshar P(2006)Guarded evaluationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.72892417:10(1051-1060)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/43.728924
Stephan PBrayton RSangiovanni-Vincentelli A(2006)Combinational test generation using satisfiabilityIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.53672315:9(1167-1176)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/43.536723
Ashar PMalik S(2006)Functional timing analysis using ATPGIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.40250114:8(1025-1030)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/43.402501
Kunz WPradhan D(2006)Recursive learningIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.31090313:9(1143-1158)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/43.310903
Chakradhar SAgrawal VRothweiler S(2006)A transitive closure algorithm for test generationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.23803812:7(1015-1028)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/43.238038
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A transitive closure algorithm for test generation

A Parallel Transitive Closure Computation Algorithm for VLSI Test Generation

A transitive closure algorithm

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