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A defect tolerant self-organizing nanoscale SIMD architecture

Published: 20 October 2006 Publication History

Abstract

The continual decrease in transistor size (through either scaled CMOS or emerging nano-technologies) promises to usher in an era of tera to peta-scale integration. However, this decrease in size is also likely to increase defect densities, contributing to the exponentially increasing cost of top-down lithography. Bottom-up manufacturing techniques, like self assembly, may provide a viable lower-cost alternative to top-down lithography, but may also be prone to higher defects. Therefore, regardless of fabrication methodology, defect tolerant architectures are necessary to exploit the full potential of future increased device densities.This paper explores a defect tolerant SIMD architecture. A key feature of our design is the ability of a large number of limited capability nodes with high defect rates (up to 30%) to self-organize into a set of SIMD processing elements. Despite node simplicity and high defect rates, we show that by supporting the familiar data parallel programming model the architecture can execute a variety of programs. The architecture efficiently exploits a large number of nodes and higher device densities to keep device switching speeds and power density low. On a medium sized system (~1cm2 area), the performance of the proposed architecture on our data parallel programs matches or exceeds the performance of an aggressively scaled out-of-order processor (128-wide, 8k reorder buffer, perfect memory system). For larger systems (>1cm2), the proposed architecture can match the performance of a chip multiprocessor with 16 aggressively scaled out-of-order cores.

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cover image ACM Conferences
ASPLOS XII: Proceedings of the 12th international conference on Architectural support for programming languages and operating systems
October 2006
440 pages
ISBN:1595934510
DOI:10.1145/1168857
  • cover image ACM SIGARCH Computer Architecture News
    ACM SIGARCH Computer Architecture News  Volume 34, Issue 5
    Proceedings of the 2006 ASPLOS Conference
    December 2006
    425 pages
    ISSN:0163-5964
    DOI:10.1145/1168919
    Issue’s Table of Contents
  • cover image ACM SIGOPS Operating Systems Review
    ACM SIGOPS Operating Systems Review  Volume 40, Issue 5
    Proceedings of the 2006 ASPLOS Conference
    December 2006
    425 pages
    ISSN:0163-5980
    DOI:10.1145/1168917
    Issue’s Table of Contents
  • cover image ACM SIGPLAN Notices
    ACM SIGPLAN Notices  Volume 41, Issue 11
    Proceedings of the 2006 ASPLOS Conference
    November 2006
    425 pages
    ISSN:0362-1340
    EISSN:1558-1160
    DOI:10.1145/1168918
    Issue’s Table of Contents
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Published: 20 October 2006

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Author Tags

  1. DNA
  2. SIMD
  3. bit-serial
  4. data parallel
  5. defect tolerance
  6. nanocomputing
  7. self-organizing

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ASPLOS XII Paper Acceptance Rate 38 of 158 submissions, 24%;
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