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Achieving high encoding efficiency with partial dynamic LFSR reseeding

Authors:

Nur A. ToubaAuthors Info & Claims

ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 9, Issue 4

Pages 500 - 516

https://doi.org/10.1145/1027084.1027089

Published: 01 October 2004 Publication History

Abstract

Previous forms of LFSR reseeding have been static (i.e., test application is stopped while each seed is loaded) and have required full reseeding (i.e., the length of the seed is equal to the length of the LFSR). A new form of LFSR reseeding is described here that is dynamic (i.e., the seed is incrementally modified while test application proceeds) and allows partial reseeding (i.e. length of the seed is less than that of the LFSR). In addition to providing better encoding efficiency, partial dynamic LFSR reseeding has a simpler hardware implementation than previous schemes based on multiple-polynomial LFSRs.

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Lim HYun HKang S(2022)A Hybrid Test Scheme for Automotive IC in Multisite TestingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.316040641:12(5671-5680)Online publication date: Dec-2022
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Gan FLiang YZhang YLi SMa F(2022)Design and Experiment of Seed Compensator Device for Transversal Sugarcane Planter with Seeds Pre-CuttingSugar Tech10.1007/s12355-021-01092-124:5(1551-1569)Online publication date: 8-Feb-2022
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Pomeranz I(2021)Compact Set of LFSR Seeds for Diagnostic Tests2021 IEEE 39th VLSI Test Symposium (VTS)10.1109/VTS50974.2021.9441041(1-7)Online publication date: 25-Apr-2021
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Index Terms

Achieving high encoding efficiency with partial dynamic LFSR reseeding
1. Hardware
  1. Hardware test
  2. Robustness

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cover image ACM Transactions on Design Automation of Electronic Systems

ACM Transactions on Design Automation of Electronic Systems Volume 9, Issue 4

October 2004

144 pages

ISSN:1084-4309

EISSN:1557-7309

DOI:10.1145/1027084

Issue’s Table of Contents

Copyright © 2004 ACM.

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Association for Computing Machinery

New York, NY, United States

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ACM Journals for the Design of Smart and Connected Systems

Publication History

Published: 01 October 2004

Published in TODAES Volume 9, Issue 4

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Cited By

Lim HYun HKang S(2022)A Hybrid Test Scheme for Automotive IC in Multisite TestingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.316040641:12(5671-5680)Online publication date: Dec-2022
https://doi.org/10.1109/TCAD.2022.3160406
Gan FLiang YZhang YLi SMa F(2022)Design and Experiment of Seed Compensator Device for Transversal Sugarcane Planter with Seeds Pre-CuttingSugar Tech10.1007/s12355-021-01092-124:5(1551-1569)Online publication date: 8-Feb-2022
https://doi.org/10.1007/s12355-021-01092-1
Pomeranz I(2021)Compact Set of LFSR Seeds for Diagnostic Tests2021 IEEE 39th VLSI Test Symposium (VTS)10.1109/VTS50974.2021.9441041(1-7)Online publication date: 25-Apr-2021
https://doi.org/10.1109/VTS50974.2021.9441041
Pomeranz I(2018)Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/320140523:4(1-18)Online publication date: 29-May-2018
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Pomeranz I(2017)Computation of Seeds for LFSR-Based n-Detection Test GenerationACM Transactions on Design Automation of Electronic Systems10.1145/299414422:2(1-13)Online publication date: 4-Jan-2017
https://dl.acm.org/doi/10.1145/2994144
Pomeranz I(2016)Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/291198322:1(1-22)Online publication date: 27-May-2016
https://dl.acm.org/doi/10.1145/2911983
Rahman MXiao KForte DZhang XShi JTehranipoor M(2014)TI-TRNGProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2593236(1-6)Online publication date: 1-Jun-2014
https://dl.acm.org/doi/10.1145/2593069.2593236
Tenentes VKavousianos X(2013)High-Quality Statistical Test Compression With Narrow ATE InterfaceIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2013.225639432:9(1369-1382)Online publication date: 1-Sep-2013
https://dl.acm.org/doi/10.1109/TCAD.2013.2256394
Tenentes VKavousianos XPhillips JHu AGraeb H(2011)Test-data volume and scan-power reduction with low ATE interface for multi-core SoCsProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132489(747-754)Online publication date: 7-Nov-2011
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Tenentes VKavousianos X(2011)Test-data volume and scan-power reduction with low ATE interface for multi-core SoCsProceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design10.1109/ICCAD.2011.6105413(747-754)Online publication date: 7-Nov-2011
https://dl.acm.org/doi/10.1109/ICCAD.2011.6105413
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