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Sensitive test data for logic expressions

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K. A. FosterAuthors Info & Claims

ACM SIGSOFT Software Engineering Notes, Volume 9, Issue 2

Pages 120 - 125

https://doi.org/10.1145/1010925.1010935

Published: 01 April 1984 Publication History

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References

[1]

{BEIZ83} Boris Beizer, "Software Testing Techniques", Van Nostrand Reinhold Company, Inc., 135 West 50th Street, New York, 1983.

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[2]

{ELDR59} R. D. Eldred, "Test Routines Based on Symbolic Logical Statements", Journal of the ACM, Vol 6, 1959, pp 33--36.

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{FOST83} K. A. Foster, "Comment on 'The Application of Error-Sensitive Testing Strategies to Debugging"', ACM Software Engineering Notes, Vol 8, Number 5, October 1983, pp 40--42.

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[4]

{HAYE71} John P. Hayes, "On Realizations of Boolean Functions Requiring a Minimal or Near-Minimal Number of Tests", IEEE Transactions on Computers, Vol C-20, No. 12, Dec 1971, pp 1506--1513.

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{HOWD82} William E. Howden, "Validation of Scientific Programs", ACM Computing Surveys, Vol 14, Number 2, June 1982, pp 193--227.

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{MYER79} Glenford J. Myers, "The Art of Software Testing", John Wiley and Sons, New York, 1979.

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Ayav T(2023)Spectral Test Generation for Boolean ExpressionsInternational Journal of Software Engineering and Knowledge Engineering10.1142/S021819402350033X33:08(1239-1260)Online publication date: 12-Jul-2023
https://doi.org/10.1142/S021819402350033X
Ufuktepe DUfuktepe EAyav T(2021)A Metric for Measuring Test Input Generation Effectiveness of Test Generation Methods for Boolean Expressions2021 15th Turkish National Software Engineering Symposium (UYMS)10.1109/UYMS54260.2021.9659647(1-6)Online publication date: 17-Nov-2021
https://doi.org/10.1109/UYMS54260.2021.9659647
Kavzak Ufuktepe DAyav TBelli F(2021)Test input generation from cause–effect graphsSoftware Quality Journal10.1007/s11219-021-09560-329:4(733-782)Online publication date: 1-Dec-2021
https://dl.acm.org/doi/10.1007/s11219-021-09560-3
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Sensitive test data for logic expressions
1. Software and its engineering
  1. Software creation and management
    1. Software verification and validation
      1. Software defect analysis
        Software testing and debugging

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cover image ACM SIGSOFT Software Engineering Notes

ACM SIGSOFT Software Engineering Notes Volume 9, Issue 2

April 1984

120 pages

ISSN:0163-5948

DOI:10.1145/1010925

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Association for Computing Machinery

New York, NY, United States

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Published: 01 April 1984

Published in SIGSOFT Volume 9, Issue 2

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Ayav T(2023)Spectral Test Generation for Boolean ExpressionsInternational Journal of Software Engineering and Knowledge Engineering10.1142/S021819402350033X33:08(1239-1260)Online publication date: 12-Jul-2023
https://doi.org/10.1142/S021819402350033X
Ufuktepe DUfuktepe EAyav T(2021)A Metric for Measuring Test Input Generation Effectiveness of Test Generation Methods for Boolean Expressions2021 15th Turkish National Software Engineering Symposium (UYMS)10.1109/UYMS54260.2021.9659647(1-6)Online publication date: 17-Nov-2021
https://doi.org/10.1109/UYMS54260.2021.9659647
Kavzak Ufuktepe DAyav TBelli F(2021)Test input generation from cause–effect graphsSoftware Quality Journal10.1007/s11219-021-09560-329:4(733-782)Online publication date: 1-Dec-2021
https://dl.acm.org/doi/10.1007/s11219-021-09560-3
Yu LTsai W(2018)Test Case Generation for Boolean Expressions by Cell CoveringIEEE Transactions on Software Engineering10.1109/TSE.2017.266918444:1(70-99)Online publication date: 1-Jan-2018
https://doi.org/10.1109/TSE.2017.2669184
Lau MYu YPoon P(2016)Test Case Generation: Specification-BasedEncyclopedia of Software Engineering10.1081/E-ESE-120044233(1200-1210)Online publication date: 28-Jul-2016
https://doi.org/10.1081/E-ESE-120044233
Paul TLau M(2012)Redefinition of Fault Classes in Logic ExpressionsProceedings of the 2012 12th International Conference on Quality Software10.1109/QSIC.2012.41(144-153)Online publication date: 27-Aug-2012
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Yu YLau M(2012)Fault-based test suite prioritization for specification-based testingInformation and Software Technology10.1016/j.infsof.2011.09.00554:2(179-202)Online publication date: 1-Feb-2012
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Fang CChen ZXu B(2012)Comparing logic coverage criteria on test case prioritizationScience China Information Sciences10.1007/s11432-012-4746-955:12(2826-2840)Online publication date: 29-Dec-2012
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Chen ZChen TXu B(2011)A revisit of fault class hierarchies in general boolean specificationsACM Transactions on Software Engineering and Methodology10.1145/2000791.200079720:3(1-11)Online publication date: 26-Aug-2011
https://dl.acm.org/doi/10.1145/2000791.2000797
Gargantini AFraser G(2011)Generating minimal fault detecting test suites for general Boolean specificationsInformation and Software Technology10.1016/j.infsof.2011.06.00853:11(1263-1273)Online publication date: Nov-2011
https://doi.org/10.1016/j.infsof.2011.06.008
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