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- chapterJanuary 2010
Statistical model applied to netflow for network intrusion detection
Transactions on computational science XIJanuary 2010, Pages 179–191The computers and network services became presence guaranteed in several places. These characteristics resulted in the growth of illicit events and therefore the computers and networks security has become an essential point in any computing environment. ...
- ArticleNovember 2009
Performance Analysis of Available Bandwidth Estimation Algorithm Based on EWMA and Kalman Filter
MINES '09: Proceedings of the 2009 International Conference on Multimedia Information Networking and Security - Volume 01Pages 604–608https://doi.org/10.1109/MINES.2009.210This paper proposes an algorithm for estimating available bandwidth of network nodes. The algorithm, based on statistical information of the network nodes, calculates link utilization and estimates the available bandwidth through the exponentially ...
- ArticleMay 2009
A Statistical Analysis of Uplink Packet Latency in GPRS Network
ICESS '09: Proceedings of the 2009 International Conference on Embedded Software and SystemsPages 593–597https://doi.org/10.1109/ICESS.2009.29In this paper, we described the correlations between uplink TCP packet latency, behavior of TCP and behavior of application. Pearson product moment correlation analysis and partial correlation analysis are worked out to characterize correlations between ...
- ArticleDecember 2008
A Statistical PCA Method for Face Recognition
IITA '08: Proceedings of the 2008 Second International Symposium on Intelligent Information Technology Application - Volume 03Pages 376–380https://doi.org/10.1109/IITA.2008.71The standard PCA algorithm has two mainly disadvantages: one is computing complexity, The other is it can only process the faces have the same face expression. In order to solve these problems, a new face recognition method called SPCA( Statistical ...
- research-articleOctober 2008
Design-Specific Optimization Considering Supply and Threshold Voltage Variations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCADICS), Volume 27, Issue 10Pages 1891–1901https://doi.org/10.1109/TCAD.2008.2003288Variations in supply (V dd) and threshold voltages (V th) significantly impact parametric yield. These variations also affect V dd and V th scaling, two power reduction techniques that effectively reduce dynamic and static power consumption. This paper ...
- research-articleAugust 2008
Statistical versus deterministic tolerance analysis using Jacobian-Torsor model
MS '08: Proceedings of the 19th IASTED International Conference on Modelling and SimulationPages 388–393In industry, the current practice concerning geometrical specifications for mechanical parts is to include both dimensions and tolerances. The objective of these specifications is to describe a class of functionally acceptable mechanical parts that are ...
- research-articleJune 2008
Transistor level gate modeling for accurate and fast timing, noise, and power analysis
DAC '08: Proceedings of the 45th annual Design Automation ConferencePages 456–461https://doi.org/10.1145/1391469.1391588Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to represent as simple ramps due to highly resistive interconnects and Miller cap ...
- research-articleJune 2008
Statistical Thermal Profile Considering Process Variations: Analysis and Applications
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCADICS), Volume 27, Issue 6Pages 1027–1040https://doi.org/10.1109/TCAD.2008.923251The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultra-deep submicrometer designs. To correctly predict performance/ leakage/reliability measures and address any yield losses during the early ...
- ArticleMarch 2008
A Statistical Algorithm for Linguistic Steganography Detection Based on Distribution of Words
ARES '08: Proceedings of the 2008 Third International Conference on Availability, Reliability and SecurityPages 558–563https://doi.org/10.1109/ARES.2008.61In this paper, a novel statistical algorithm for linguistic steganography detection, which takes advantage of distribution of words in the text segment detected, is presented. Linguistic steganography is the art of using written natural language to hide ...
- ArticleJune 2007
Statistical framework for technology-model-product co-design and convergence
DAC '07: Proceedings of the 44th annual Design Automation ConferencePages 503–508https://doi.org/10.1145/1278480.1278610This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical data-driven approach identifies device characteristics that are most ...
- research-articleSeptember 2006
Keypoint Recognition Using Randomized Trees
IEEE Transactions on Pattern Analysis and Machine Intelligence (ITPM), Volume 28, Issue 9Pages 1465–1479https://doi.org/10.1109/TPAMI.2006.188In many 3D object-detection and pose-estimation problems, runtime performance is of critical importance. However, there usually is time to train the system, which we will show to be very useful. Assuming that several registered images of the target ...
- ArticleJuly 2006
Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits
DAC '06: Proceedings of the 43rd annual Design Automation ConferencePages 791–796https://doi.org/10.1145/1146909.1147109This paper proposes the use of Karhunen-Loève Expansion (KLE) for accurate and efficient modeling of intra-die correlations in the semiconductor manufacturing process. We demonstrate that the KLE provides a significantly more accurate representation of ...
- ArticleJuly 2006
Quality control of an industrial unit production using qualitative methods
In this work is presented the application of qualitative models and statistical methods in quality control of production procedures of various components of an automatic industrial press machine. The methodology of creating a descriptive model of a ...
- ArticleJuly 2006
Leveraging relative object popularity as the sole parameter for dynamic cache size tuning to shorten the information retrieval roundtrip time over the web
In this paper the novel model for dynamic cache size tuning: CACHERP is proposed. It is a unique model capable of maintaining the given hit ratio consistently on the fly. This model achieves its objective by leveraging the current relative popularity ...
- research-articleOctober 2005
Using One-Class and Two-Class SVMs for Multiclass Image Annotation
IEEE Transactions on Knowledge and Data Engineering (IEEECS_TKDE), Volume 17, Issue 10Pages 1333–1346https://doi.org/10.1109/TKDE.2005.170We propose using one-class, two-class, and multiclass SVMs to annotate images for supporting keyword retrieval of images. Providing automatic annotation requires an accurate mapping of images' low-level perceptual features (e.g., color and texture) to ...
- ArticleAugust 2005
Probabilistic analysis of data dealing with modeling of analgesic effect of naproxen loaded nanoparticles
SMO'05: Proceedings of the 5th WSEAS international conference on Simulation, modelling and optimizationPages 488–493This paper is based on interactive work between disciplines of engineering and pharmacy. Authors used well known reliability techniques [1] to study the probabilistic effect of pain relieving medicines such as naproxen on animals subjected to pain ...
- ArticleJune 2005
OPERA: optimization with ellipsoidal uncertainty for robust analog IC design
DAC '05: Proceedings of the 42nd annual Design Automation ConferencePages 632–637https://doi.org/10.1145/1065579.1065746As the design-manufacturing interface becomes increasingly complicated with IC technology scaling, the corresponding process variability poses great challenges for nanoscale analog/RF design. Design optimization based on the enumeration of process ...
- ArticleJune 2005
Leakage minimization of nano-scale circuits in the presence of systematic and random variations
DAC '05: Proceedings of the 42nd annual Design Automation ConferencePages 541–546https://doi.org/10.1145/1065579.1065719This paper presents a novel gate sizing methodology to minimize the leakage power in the presence of process variations. The leakage and delay are modeled as posynomials functions to formulate a geometric programming problem. The existing statistical ...
- articleJanuary 2005
Deterministic and statistical admission control for QoS-Aware embedded systems
This paper presents two classes of admission control schemes for embedded system applications that have real-time constraints but with composite characteristics in request arrivals and resource requirements. First, we present admission control tests ...