research-article

Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside Tests

Author:

Irith PomeranzAuthors Info & Claims

ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 23, Issue 4

Article No.: 53, Pages 1 - 18

https://doi.org/10.1145/3201405

Published: 29 May 2018 Publication History

Abstract

Close-to-functional scan-based tests are expected to create close-to-functional operation conditions in order to avoid overtesting of delay faults. Existing metrics for the proximity to functional operation conditions are based on the scan-in state. For example, they consider the distance between the scan-in state and a reachable state (a state that the circuit can visit during functional operation). However, the deviation from functional operation conditions can increase during a test beyond the deviation that is measured by the scan-in state. To ensure that the deviation does not increase, this article introduces the concept of a partially invariant pattern. The article describes a procedure for extracting partially invariant patterns from functional broadside tests whose scan-in states are reachable states. Being partially specified, partially invariant patterns are suitable for test data compression. The article studies the use of partially invariant patterns for linear-feedback shift-register (LFSR) based test data compression. Noting that a seed may not exist for a given partially invariant pattern with a given LFSR, the procedure described in this article uses an iterative process that not only matches a seed to a partially invariant pattern, but also adjusts the partially invariant pattern based on the test that the seed produces. The article also addresses the selection of LFSRs for the generation of close-to-functional broadside tests based on partially invariant patterns. Experimental results are presented to demonstrate the feasibility of the procedure.

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Cited By

Pomeranz I(2020)Functional Broadside Tests Under Broadcast ScanIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.293932439:10(3139-3143)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2939324
Pomeranz I(2018)Boundary-Functional Broadside and Skewed-Load TestsACM Transactions on Design Automation of Electronic Systems10.1145/327697624:1(1-20)Online publication date: 21-Dec-2018
https://dl.acm.org/doi/10.1145/3276976
Pomeranz I(2018)On Close-to-Functional Test Sequences2018 IEEE International Test Conference (ITC)10.1109/TEST.2018.8624703(1-8)Online publication date: Oct-2018
https://doi.org/10.1109/TEST.2018.8624703

Index Terms

Partially Invariant Patterns for LFSR-Based Generation of Close-to-Functional Broadside Tests
1. Hardware
  1. Hardware test
    1. Design for testability
      1. Test data compression

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Published In

cover image ACM Transactions on Design Automation of Electronic Systems

ACM Transactions on Design Automation of Electronic Systems Volume 23, Issue 4

Special Section on Advances in Physical Design Automation and Regular Papers

July 2018

316 pages

ISSN:1084-4309

EISSN:1557-7309

DOI:10.1145/3217208

Editor:
Naehyuck Chang
Korea Advanced Institute of Science and Technology, Korea

Issue’s Table of Contents

Copyright © 2018 ACM.

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ACM Journals for the Design of Smart and Connected Systems

Publication History

Published: 29 May 2018

Accepted: 01 March 2018

Revised: 01 March 2018

Received: 01 June 2017

Published in TODAES Volume 23, Issue 4

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Cited By

Pomeranz I(2020)Functional Broadside Tests Under Broadcast ScanIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.293932439:10(3139-3143)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2939324
Pomeranz I(2018)Boundary-Functional Broadside and Skewed-Load TestsACM Transactions on Design Automation of Electronic Systems10.1145/327697624:1(1-20)Online publication date: 21-Dec-2018
https://dl.acm.org/doi/10.1145/3276976
Pomeranz I(2018)On Close-to-Functional Test Sequences2018 IEEE International Test Conference (ITC)10.1109/TEST.2018.8624703(1-8)Online publication date: Oct-2018
https://doi.org/10.1109/TEST.2018.8624703

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