research-article

SATTA: A Self-Adaptive Temperature-Based TDF Awareness Methodology for Dynamically Reconfigurable FPGAs

Authors:

Stefano Di Carlo,

Giulio Gambardella,

Paolo Prinetto,

Pascal TrottaAuthors Info & Claims

ACM Transactions on Reconfigurable Technology and Systems (TRETS), Volume 8, Issue 1

Article No.: 1, Pages 1 - 22

https://doi.org/10.1145/2659001

Published: 06 March 2015 Publication History

Abstract

Dependability issues due to nonfunctional properties are emerging as a major cause of faults in modern digital systems. Effective countermeasures have to be developed to properly manage their critical timing effects. This article presents a methodology to avoid transition delay faults in field-programmable gate array (FPGA)-based systems, with low area overhead. The approach is able to exploit temperature information and aging characteristics to minimize the cost in terms of performances degradation and power consumption. The architecture of a hardware manager able to avoid delay faults is presented and analyzed extensively, as well as its integration in the standard implementation design flow.

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Cited By

Pomeranz I(2022)Increasing the Fault Coverage of a Truncated Test SetACM Transactions on Design Automation of Electronic Systems10.1145/350845927:6(1-16)Online publication date: 18-Feb-2022
https://dl.acm.org/doi/10.1145/3508459
Sharma DKirischian L(2021)A Method for Run-Time Prediction of On-Chip Thermal Conditions in Dynamically Reconfigurable SOPCsInternational Journal of Reconfigurable Computing10.1155/2021/88187882021Online publication date: 1-Jan-2021
https://dl.acm.org/doi/10.1155/2021/8818788
Sharma DKirischian L(2021)A Decision-Making Method Providing Sustainability to FPGA-Based SoCs by Run-Time Structural Adaptation to Mode of Operation, Power Budget, and Die Temperature VariationsInternational Journal of Reconfigurable Computing10.1155/2021/55129382021Online publication date: 1-Jan-2021
https://dl.acm.org/doi/10.1155/2021/5512938
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Index Terms

SATTA: A Self-Adaptive Temperature-Based TDF Awareness Methodology for Dynamically Reconfigurable FPGAs
1. Hardware
  1. Hardware test
  2. Robustness

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Published In

cover image ACM Transactions on Reconfigurable Technology and Systems

ACM Transactions on Reconfigurable Technology and Systems Volume 8, Issue 1

February 2015

127 pages

ISSN:1936-7406

EISSN:1936-7414

DOI:10.1145/2744082

Editor:
Steve Wilton
Department of Electrical and Computer Engineering/University of British Columbia/Kaiser 4112, 5500-2332 Main Mall/Vancouver, BC V6T 1Z4 Canada

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Copyright © 2015 ACM.

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Association for Computing Machinery

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Publication History

Published: 06 March 2015

Accepted: 01 July 2014

Revised: 01 May 2014

Received: 01 December 2013

Published in TRETS Volume 8, Issue 1

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Cited By

Pomeranz I(2022)Increasing the Fault Coverage of a Truncated Test SetACM Transactions on Design Automation of Electronic Systems10.1145/350845927:6(1-16)Online publication date: 18-Feb-2022
https://dl.acm.org/doi/10.1145/3508459
Sharma DKirischian L(2021)A Method for Run-Time Prediction of On-Chip Thermal Conditions in Dynamically Reconfigurable SOPCsInternational Journal of Reconfigurable Computing10.1155/2021/88187882021Online publication date: 1-Jan-2021
https://dl.acm.org/doi/10.1155/2021/8818788
Sharma DKirischian L(2021)A Decision-Making Method Providing Sustainability to FPGA-Based SoCs by Run-Time Structural Adaptation to Mode of Operation, Power Budget, and Die Temperature VariationsInternational Journal of Reconfigurable Computing10.1155/2021/55129382021Online publication date: 1-Jan-2021
https://dl.acm.org/doi/10.1155/2021/5512938
Pomeranz I(2021)Covering Test Holes of Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/344128226:3(1-15)Online publication date: 6-Jan-2021
https://dl.acm.org/doi/10.1145/3441282
Pomeranz I(2021)Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input VectorsACM Transactions on Design Automation of Electronic Systems10.1145/344001326:4(1-15)Online publication date: 15-Jan-2021
https://dl.acm.org/doi/10.1145/3440013
Mottaghi MSedighi MSaheb Zamani M(2021)FIFA: A Fully Invertible FPGA Architecture to Reduce BTI-Induced Aging EffectsIEEE Transactions on Computers10.1109/TC.2021.3127082(1-1)Online publication date: 2021
https://doi.org/10.1109/TC.2021.3127082
Pomeranz I(2020)Target Faults for Test Compaction Based on Multicycle TestsACM Transactions on Design Automation of Electronic Systems10.1145/337527825:2(1-14)Online publication date: 17-Jan-2020
https://dl.acm.org/doi/10.1145/3375278
Mottaghi MSedighi MZamani M(2020)Aging Mitigation in FPGAs Considering Delay, Power, and TemperatureIEEE Transactions on Reliability10.1109/TR.2019.289759169:2(833-844)Online publication date: Jun-2020
https://doi.org/10.1109/TR.2019.2897591
Sadeghi-Kohan SKamal MNavabi Z(2020)Self-Adjusting Monitor for Measuring Aging Rate and AdvancementIEEE Transactions on Emerging Topics in Computing10.1109/TETC.2017.27714418:3(627-641)Online publication date: 1-Jul-2020
https://doi.org/10.1109/TETC.2017.2771441
Sharma DKirischian VKirischian L(2019)On-Chip Thermal Balancing using Dynamic Structural Adaptation of FPGA-Based Multi-task SoPCs for Space-Borne Applications2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS)10.1109/AHS.2019.00008(79-86)Online publication date: Jul-2019
https://doi.org/10.1109/AHS.2019.00008
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