"Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under ..."

Joonho Kong et al. (2012)

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DOI: 10.1109/TVLSI.2011.2159634

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type: Journal Article

metadata version: 2020-03-11

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Joonho Kong, Yan Pan, Serkan Ozdemir, Anitha Mohan, Gokhan Memik, Sung Woo Chung:
Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1532-1536 (2012)

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