"Incorporating Process Variations Into SRAM Electromigration Reliability ..."

Zhong Guan, Malgorzata Marek-Sadowska (2016)

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DOI: 10.1109/TVLSI.2015.2501900

access: closed

type: Journal Article

metadata version: 2020-03-11

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Zhong Guan, Malgorzata Marek-Sadowska:
Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2195-2207 (2016)

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