"Degradation of InGaN laser diodes caused by temperature- and ..."

Carlo De Santi et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.118

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type: Journal Article

metadata version: 2024-05-07

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Carlo De Santi, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni:
Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes. Microelectron. Reliab. 64: 623-626 (2016)

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