"TCAD for reliability."

Paul Pfäffli et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.025

access: closed

type: Journal Article

metadata version: 2020-02-22

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Paul Pfäffli, P. Tikhomirov, X. Xu, I. Avci, Y.-S. Oh, P. Balasingam, S. Krishnamoorthy, T. Ma:
TCAD for reliability. Microelectron. Reliab. 52(9-10): 1761-1768 (2012)

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