"Hot carrier degradation behavior in SOI dynamic-threshold-voltage ..."

Ru Huang et al. (2003)

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DOI: 10.1016/S0026-2714(03)00038-6

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type: Journal Article

metadata version: 2024-06-04

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Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang:
Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. Microelectron. Reliab. 43(5): 707-711 (2003)

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