"A Novel Approach for Testing Memories Using a Built-In Self Testing Technique."

Kim T. Le, Kewal K. Saluja (1986)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2006-04-20

- no documents available
- export record
  dblp key:
  - conf/itc/LeS86
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/LeS86
Kim T. Le, Kewal K. Saluja:
A Novel Approach for Testing Memories Using a Built-In Self Testing Technique. ITC 1986: 830-839

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.