"Generating test patterns for sequential circuits using random patterns by ..."

Mohammad Hashem Haghbayan et al. (2010)

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DOI: 10.1109/EWDTS.2010.5742079

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mohammad Hashem Haghbayan, Alireza Yazdanpanah, Sara Karamati, Ramyar Saeedi, Zainalabedin Navabi:
Generating test patterns for sequential circuits using random patterns by PLI functions. EWDTS 2010: 456-461

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