"Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits."

Oriol Roig et al. (1997)

> Home

Details and statistics

DOI: 10.1145/266021.266300

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/RoigCPP97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/RoigCPP97
Oriol Roig, Jordi Cortadella, Marco A. Peña, Enric Pastor:
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits. DAC 1997: 620-625

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.