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Krzysztof Jurga

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2020 – today

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2024
[c5]
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Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim:
Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. ITC 2024: 280-285
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Stephen Sunter, Krzysztof Jurga:
Digital Scan and ATPG for Analog Circuits. ITC 2024: 339-347
2021
[c3]
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Stephen Sunter, Krzysztof Jurga:
Automated Observability Analysis for Mixed-Signal Circuits. VTS 2021: 1-6

2010 – 2019

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2018
[c2]
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Krzysztof Jurga, Stephen Sunter:
Measuring mixed-signal test stimulus quality. ETS 2018: 1-6
2016
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Stephen Sunter, Krzysztof Jurga, Andrew Laidler:
Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(12): 2313-2322 (2016)
2014
[c1]
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Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren:
Practical random sampling of potential defects for analog fault simulation. ITC 2014: 1-10

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