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2020 – today
- 2024
[j64]Carlos Solorzano
, Du-Ming Tsai:
Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks. IEEE Trans Autom. Sci. Eng. 21(3): 2564-2573 (2024)- 2022
- [j63]Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Mabel C. Chou, Chih-Hung Jen, Jen-Hsuan Tsou:
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 19(3): 1530-1541 (2022) - [j62]Shu-Kai S. Fan, Chun-Wei Cheng, Du-Ming Tsai:
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. IEEE Trans Autom. Sci. Eng. 19(4): 3068-3082 (2022) - 2021
- [j61]Du-Ming Tsai, Po-Hao Jen:
Autoencoder-based anomaly detection for surface defect inspection. Adv. Eng. Informatics 48: 101272 (2021) - [j60]Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou:
Auto-Annotated Deep Segmentation for Surface Defect Detection. IEEE Trans. Instrum. Meas. 70: 1-10 (2021) - 2020
- [j59]Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng:
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 17(4): 1925-1936 (2020) - [j58]Du-Ming Tsai, Yi-Hsiang Chou:
Fast and Precise Positioning in PCBs Using Deep Neural Network Regression. IEEE Trans. Instrum. Meas. 69(7): 4692-4701 (2020)
2010 – 2019
- 2019
- [c11]Du-Ming Tsai, Morris S. K. Fan, Yi-Quan Huang, Wei-Yao Chiu:
Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification. VISIGRAPP (5: VISAPP) 2019: 234-240 - 2017
- [j57]Du-Ming Tsai, Wan-Ling Chen:
Coffee plantation area recognition in satellite images using Fourier transform. Comput. Electron. Agric. 135: 115-127 (2017) - [j56]Du-Ming Tsai, Yi-Chun Hsieh:
Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique. IEEE Trans. Instrum. Meas. 66(11): 2858-2868 (2017) - 2015
- [j55]Du-Ming Tsai, Guan-Nan Li, Wei-Chen Li, Wei-Yao Chiu:
Defect detection in multi-crystal solar cells using clustering with uniformity measures. Adv. Eng. Informatics 29(3): 419-430 (2015) - [j54]Du-Ming Tsai, Wei-Yao Chiu, Men-Han Lee:
Optical flow-motion history image (OF-MHI) for action recognition. Signal Image Video Process. 9(8): 1897-1906 (2015) - [c10]Du-Ming Tsai, Wei-Yao Chiu, Tzu-Hsun Tseng:
Moving object detection from a mobile robot using basis image matching. Intelligent Robots and Computer Vision: Algorithms and Techniques 2015: 940603 - [c9]Du-Ming Tsai, Yan-Hsin Tseng, Wei-Yao Chiu:
Surface defect detection in low-contrast images using basis image representation. MVA 2015: 186-189 - 2014
- [j53]Du-Ming Tsai, Hao Hsu, Wei-Yao Chiu:
3-D vision-assist guidance for robots or the visually impaired. Ind. Robot 41(4): 351-364 (2014) - [j52]Wei-Yao Chiu, Du-Ming Tsai:
Dual-mode detection for foreground segmentation in low-contrast video images. J. Real Time Image Process. 9(4): 647-659 (2014) - 2013
- [j51]Du-Ming Tsai, Tzu-Hsun Tseng:
A template reconstruction scheme for moving object detection from a mobile robot. Ind. Robot 40(6): 559-573 (2013) - [j50]Du-Ming Tsai, Shih-Chieh Wu, Wei-Yao Chiu:
Defect Detection in Solar Modules Using ICA Basis Images. IEEE Trans. Ind. Informatics 9(1): 122-131 (2013) - [c8]Du-Ming Tsai, Wei-Yao Chiu:
A real-time ICA-based activity recognition in video sequences. MVA 2013: 467-470 - [c7]Du-Ming Tsai, Wei-Yao Chiu:
Dual-mode Detection for Foreground Segmentation in Low-contrast Video Images. VISAPP (1) 2013: 431-435 - 2012
- [j49]Du-Ming Tsai, Ming-Chun Chen, Wei-Chen Li, Wei-Yao Chiu:
A fast regularity measure for surface defect detection. Mach. Vis. Appl. 23(5): 869-886 (2012) - [j48]Wei-Chen Li, Du-Ming Tsai:
Wavelet-based defect detection in solar wafer images with inhomogeneous texture. Pattern Recognit. 45(2): 742-756 (2012) - [j47]Du-Ming Tsai, I-Yung Chiang, Ya-Hui Tsai:
A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection. IEEE Trans. Ind. Informatics 8(1): 128-137 (2012) - [c6]Wei-Yao Chiu, Du-Ming Tsai:
ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds. GRAPP/IVAPP 2012: 519-522 - 2011
- [j46]Ya-Hui Tsai, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu, Ming-Chin Lin:
Surface defect detection of 3D objects using robot vision. Ind. Robot 38(4): 381-398 (2011) - [j45]Du-Ming Tsai, Hsin-Yang Tsai:
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis. Mach. Vis. Appl. 22(4): 629-649 (2011) - [j44]Du-Ming Tsai, Chung-Chan Lin:
Fuzzy C-means based clustering for linearly and nonlinearly separable data. Pattern Recognit. 44(8): 1750-1760 (2011) - [j43]Du-Ming Tsai, Jie-Yu Luo:
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces. IEEE Trans. Ind. Informatics 7(1): 125-135 (2011) - [j42]Wei-Chen Li, Du-Ming Tsai:
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection. IEEE Trans. Ind. Informatics 7(1): 136-147 (2011) - 2010
- [j41]Wei-Yao Chiu, Du-Ming Tsai:
A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences. EURASIP J. Adv. Signal Process. 2010 (2010) - [j40]Du-Ming Tsai, Chih-Chieh Chang, Shin-Min Chao:
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion. Image Vis. Comput. 28(3): 491-501 (2010) - [j39]Yan-Hsin Tseng, Du-Ming Tsai:
Defect detection of uneven brightness in low-contrast images using basis image representation. Pattern Recognit. 43(3): 1129-1141 (2010) - [j38]Shin-Min Chao, Du-Ming Tsai:
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images. Pattern Recognit. 43(5): 1917-1931 (2010) - [j37]Shin-Min Chao, Du-Ming Tsai:
An improved anisotropic diffusion model for detail- and edge-preserving smoothing. Pattern Recognit. Lett. 31(13): 2012-2023 (2010) - [c5]Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu, Wei-Chen Li:
Anisotropic diffusion-based detail-preserving smoothing for image restoration. ICIP 2010: 4145-4148 - [c4]Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu:
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces. ICPR 2010: 4408-4411 - [c3]Du-Ming Tsai, Wei-Yao Chiu:
A Macro-observation Approach of Intelligence Video Surveillance for Real-Time Unusual Event Detection. UIC/ATC Workshops 2010: 105-110
2000 – 2009
- 2009
- [j36]Du-Ming Tsai, Su-Ta Chuang:
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. Mach. Vis. Appl. 20(6): 423-434 (2009) - [j35]Du-Ming Tsai, Shia-Chih Lai:
Independent Component Analysis-Based Background Subtraction for Indoor Surveillance. IEEE Trans. Image Process. 18(1): 158-167 (2009) - 2008
- [j34]Shin-Min Chao, Du-Ming Tsai:
An anisotropic diffusion-based defect detection for low-contrast glass substrates. Image Vis. Comput. 26(2): 187-200 (2008) - [j33]Chi-Jie Lu, Du-Ming Tsai:
Independent component analysis-based defect detection in patterned liquid crystal display surfaces. Image Vis. Comput. 26(7): 955-970 (2008) - [j32]Du-Ming Tsai, Shia-Chih Lai:
Defect detection in periodically patterned surfaces using independent component analysis. Pattern Recognit. 41(9): 2812-2832 (2008) - [j31]Du-Ming Tsai, Wei-Yao Chiu:
Motion detection using Fourier image reconstruction. Pattern Recognit. Lett. 29(16): 2145-2155 (2008) - 2007
- [j30]Du-Ming Tsai, Chih-Chia Kuo:
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction. Mach. Vis. Appl. 18(6): 383-400 (2007) - 2006
- [j29]Du-Ming Tsai, Ping-Chieh Lin, Chi-Jie Lu:
An independent component analysis-based filter design for defect detection in low-contrast surface images. Pattern Recognit. 39(9): 1679-1694 (2006) - [j28]Shin-Min Chao, Du-Ming Tsai:
Astronomical image restoration using an improved anisotropic diffusion. Pattern Recognit. Lett. 27(5): 335-344 (2006) - [c2]Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen:
Independent component analysis based filter design for defect detection in low-contrast textured images. ICPR (2) 2006: 231-234 - [c1]Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang:
Defect detection in low-contrast glass substrates using anisotropic diffusion. ICPR (1) 2006: 654-657 - 2005
- [j27]Du-Ming Tsai, Shin-Min Chao:
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. Image Vis. Comput. 23(3): 325-338 (2005) - [j26]Du-Ming Tsai, Ron-Hwa Yang:
An eigenvalue-based similarity measure and its application in defect detection. Image Vis. Comput. 23(12): 1094-1101 (2005) - [j25]Erwie Zahara, Shu-Kai S. Fan, Du-Ming Tsai:
Optimal multi-thresholding using a hybrid optimization approach. Pattern Recognit. Lett. 26(8): 1082-1095 (2005) - [j24]Du-Ming Tsai, Cheng-Hsiang Yang:
A quantile-quantile plot based pattern matching for defect detection. Pattern Recognit. Lett. 26(13): 1949-1962 (2005) - 2003
- [j23]Du-Ming Tsai, Tse-Yun Huang:
Automated surface inspection for statistical textures. Image Vis. Comput. 21(4): 307-323 (2003) - [j22]Du-Ming Tsai, Cheng-Huei Chiang:
Automatic band selection for wavelet reconstruction in the application of defect detection. Image Vis. Comput. 21(5): 413-431 (2003) - [j21]Du-Ming Tsai, Ya-Hui Tsai:
Defect detection in textured surfaces using color ring-projection correlation. Mach. Vis. Appl. 13(4): 194-200 (2003) - [j20]Du-Ming Tsai, Chien-Ta Lin, Jeng-Fung Chen:
The evaluation of normalized cross correlations for defect detection. Pattern Recognit. Lett. 24(15): 2525-2535 (2003) - [j19]Du-Ming Tsai, Chien-Ta Lin:
Fast normalized cross correlation for defect detection. Pattern Recognit. Lett. 24(15): 2625-2631 (2003) - 2002
- [j18]Du-Ming Tsai, Ya-Hui Tsai:
Rotation-invariant pattern matching with color ring-projection. Pattern Recognit. 35(1): 131-141 (2002) - [j17]Du-Ming Tsai, Cheng-Huei Chiang:
Rotation-invariant pattern matching using wavelet decomposition. Pattern Recognit. Lett. 23(1-3): 191-201 (2002) - 2001
- [j16]Du-Ming Tsai, Song-Kuaw Wu, Mu-Chen Chen:
Optimal Gabor filter design for texture segmentation using stochastic optimization. Image Vis. Comput. 19(5): 299-316 (2001) - [j15]Du-Ming Tsai, Bo Hsiao:
Automatic surface inspection using wavelet reconstruction. Pattern Recognit. 34(6): 1285-1305 (2001)
1990 – 1999
- 1999
- [j14]Du-Ming Tsai, C.-Y. Hsieh:
Automated surface inspection for directional textures. Image Vis. Comput. 18(1): 49-62 (1999) - [j13]Du-Ming Tsai, Chi-Fong Tseng:
Surface roughness classification for castings. Pattern Recognit. 32(3): 389-405 (1999) - [j12]Du-Ming Tsai, Huei-Tse Hou, H.-J. Su:
Boundary-based corner detection using eigenvalues of covariance matrices. Pattern Recognit. Lett. 20(1): 31-40 (1999) - [j11]Mu-Chen Chen, Du-Ming Tsai, Hsien-Yu Tseng:
A stochastic optimization approach for roundness measurement. Pattern Recognit. Lett. 20(7): 707-719 (1999) - 1998
- [j10]Du-Ming Tsai, Chin-Tun Lin:
A moment-preserving approach for depth from defocus. Pattern Recognit. 31(5): 551-560 (1998) - [j9]Du-Ming Tsai, Hu-Jong Wang:
Segmenting focused objects in complex visual images. Pattern Recognit. Lett. 19(10): 929-940 (1998) - 1997
- [j8]Du-Ming Tsai:
An improved generalized Hough transform for the recognition of overlapping objects. Image Vis. Comput. 15(12): 877-888 (1997) - [j7]Du-Ming Tsai:
Boundary-based corner detection using neural networks. Pattern Recognit. 30(1): 85-97 (1997) - 1996
- [j6]Du-Ming Tsai, Tsai Ray-Yuan:
Use neural networks to determine matching order for recognizing overlapping objects. Pattern Recognit. Lett. 17(10): 1077-1088 (1996) - 1995
- [j5]Du-Ming Tsai:
A three-dimensional machine-vision approach for automatic robot programming. J. Intell. Robotic Syst. 12(1): 23-48 (1995) - [j4]Du-Ming Tsai, Ming-fong Chen:
Object recognition by a linear weight classifier. Pattern Recognit. Lett. 16(6): 591-600 (1995) - [j3]Du-Ming Tsai:
A fast thresholding selection procedure for multimodal and unimodal histograms. Pattern Recognit. Lett. 16(6): 653-666 (1995) - 1994
- [j2]Du-Ming Tsai, Ming-fong Chen:
Curve fitting approach for tangent angle and curvature measurements. Pattern Recognit. 27(5): 699-711 (1994) - 1992
- [j1]Du-Ming Tsai, Ying-Hsiung Chen:
A fast histogram-clustering approach for multi-level thresholding. Pattern Recognit. Lett. 13(4): 245-252 (1992)
Coauthor Index
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