"Statistical SRAM Read Access Yield Improvement Using Negative Capacitance ..."

Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry (2013)

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DOI: 10.1109/TVLSI.2011.2178046

access: closed

type: Journal Article

metadata version: 2020-03-11

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Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry:
Statistical SRAM Read Access Yield Improvement Using Negative Capacitance Circuits. IEEE Trans. Very Large Scale Integr. Syst. 21(1): 92-101 (2013)

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