"Fast Semiconductor Reliability Assessments Using SPRT."

Wei-Ting Kary Chien, Andrew Chung, Way Kuo (2019)

> Home

Details and statistics

DOI: 10.1109/TR.2018.2869597

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/ChienCK19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/ChienCK19
Wei-Ting Kary Chien, Andrew Chung, Way Kuo:
Fast Semiconductor Reliability Assessments Using SPRT. IEEE Trans. Reliab. 68(2): 526-538 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.