"Low-Power Die-Level Process Variation and Temperature Monitors for Yield ..."

Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez (2012)

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DOI: 10.1109/TIM.2012.2184195

access: closed

type: Journal Article

metadata version: 2020-06-08

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Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez:
Low-Power Die-Level Process Variation and Temperature Monitors for Yield Analysis and Optimization in Deep-Submicron CMOS. IEEE Trans. Instrum. Meas. 61(8): 2212-2221 (2012)

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