"Intelligent Reflective Surface-Aided Channel Phase Probing for ..."

Xinjin Lu et al. (2024)

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DOI: 10.1109/TCE.2024.3410280

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type: Journal Article

metadata version: 2025-01-25

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Xinjin Lu, Yuxin Shi, Zhi Lin, Bingyin Ren, Jinliang Li, Jing Lei:
Intelligent Reflective Surface-Aided Channel Phase Probing for Physical-Layer Key Generation in Transportation Systems. IEEE Trans. Consumer Electron. 70(4): 7056-7065 (2024)

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