"An efficient test vector compression scheme using selective Huffman coding."

Abhijit Jas et al. (2003)

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DOI: 10.1109/TCAD.2003.811452

access: closed

type: Journal Article

metadata version: 2020-09-24

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Abhijit Jas, Jayabrata Ghosh-Dastidar, Mom-Eng Ng, Nur A. Touba:
An efficient test vector compression scheme using selective Huffman coding. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(6): 797-806 (2003)

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