"Experimental and simulation study of the correlation between displacement ..."

Qingkui Yu et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.083

access: closed

type: Journal Article

metadata version: 2020-02-22

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Qingkui Yu, Yi Sun, Zheng Li, Bo Mei, Xiaoliang Li, He Lv, Pengwei Li, Min Tang:
Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices. Microelectron. Reliab. 88-90: 952-956 (2018)

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