"Failure investigation on copper-plated blind vias in PCB."

Li-Na Ji, Yi Gong, Zhen-Guo Yang (2010)

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DOI: 10.1016/J.MICROREL.2010.04.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Li-Na Ji, Yi Gong, Zhen-Guo Yang:
Failure investigation on copper-plated blind vias in PCB. Microelectron. Reliab. 50(8): 1163-1170 (2010)

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