"Investigation on dependency of thermal characteristics on gate/drain bias ..."

Peng Zhao et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105970

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type: Journal Article

metadata version: 2023-11-28

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Peng Zhao, Lei Cao, Fan Zhang, Haoqing Xu, Weizhuo Gan, Qingzhu Zhang, Zhaohao Zhang, Jiaxin Yao, Guoliang Tian, Kun Luo, Zhenhua Wu, Huaxiang Yin:
Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. Microelectron. J. 141: 105970 (2023)

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