"Insulator defect detection based on improved you-only-look-once v4 in ..."

Suzhen Wang et al. (2023)

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DOI: 10.1117/1.JEI.32.2.023029

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type: Journal Article

metadata version: 2024-11-28

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Suzhen Wang, Hao Xu, Mingwei Shao, Lin Zhao:
Insulator defect detection based on improved you-only-look-once v4 in complex scenarios. J. Electronic Imaging 32(2) (2023)

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