"Delay Testing: Improving Test Quality and Avoiding Over-testing."

Seiji Kajihara, Satoshi Ohtake, Tomokazu Yoneda (2011)

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DOI: 10.11185/IMT.6.1053

access: closed

type: Journal Article

metadata version: 2024-08-31

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Seiji Kajihara, Satoshi Ohtake, Tomokazu Yoneda:
Delay Testing: Improving Test Quality and Avoiding Over-testing. Inf. Media Technol. 6(4): 1053-1066 (2011)

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