"Carrier separation and Vth measurements of W-La2O3 ..."

Joel Molina Reyes et al. (2007)

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DOI: 10.1587/ELEX.4.185

access: open

type: Journal Article

metadata version: 2021-02-12

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Joel Molina Reyes, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai:
Carrier separation and Vth measurements of W-La₂O₃ gated MOSFET structures after electrical stress. IEICE Electron. Express 4(6): 185-191 (2007)

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