"Delay Fault Testing: Choosing Between Random SIC and Random MIC Test ..."

Arnaud Virazel et al. (2001)

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DOI: 10.1023/A:1012259227622

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type: Journal Article

metadata version: 2023-03-21

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Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch:
Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. J. Electron. Test. 17(3-4): 233-241 (2001)

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